IF YOU CAN'T MEASURE IT, YOU CAN'T MANAGE IT #TeraSpectra Comparison to Legacy Tools #AFM #SEM #TEM #FTIR #NMR #Microscope #Microscopy

Commonly Deployed Legacy Technologies Such As Optical, X Ray, Atomic Force Microscopy, SEM, TEM, Focused Ion Beam etc. are Limiting Metrologies which:

• Require Multiple Measurement Tools for 3D & In Depth Analysis
• Require Extensive Sample Preparation
• Are Expensive and Destructive
• Do Not Facilitate Operational Stess Testing Before & After Anlaysis.
• Do Not Provide Concurrent Spectral & Imaging Analysis

Applied Research & Photonics, Inc. TNS3DIMS – Terahertz Nanoscanning 3D Imager & Spectrometer System, uses proprietary Dendrimer Dipole Excitation (DDE) technology to deliver unsurpassed analytical, and imaging capabilities.

• Non destructive , Non contact, Non-Ionizing
• Surface & Sub Surface, Volumetric & Layer x Layer
• Inspect 0D, 1D, 2D and 3D NanoMaterials
• Lattice Defects, Stacking Faults, Nano-Voids
• Particle, Cracks, Non-Uniformity, Inclusion, Phases
• Multi Layer Interfacial Analysis - Examples:

• Misfit-lattice interface (type-1)
• Rough surface interface (type-3) → Layer-1/Layer-2
• Diffusion type interface (type-4) → Layer-2/Layer-3
• Optical Critical Dimensions of Hidden Structures & Features
• https://www.dhirubhai.net/posts/anis-rahman-phd-50823014_example-of-applications-activity-7228690252687642624-W7cR?utm_source=share&utm_medium=member_desktop

John Mahoney Senior Consultant Applied Research & Phontonics, Inc.

https://www.dhirubhai.net/in/john-mahoney-11b513a/

[email protected] 208-867-4876

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