What is Scan Compression, EDT and/or CoDec in DFT?
Scan Compression is a DFT technique that reduces the testing time and thus cost by compressing(or reducing) the scan chain lengths. The need for such a technique arises due to the fact that we have limited pins at the SoC, but millions of Flip Flops & Gates; now due to the huge number of flops in a chain the test time is very large due to the large number of shift operations.
In scan compression two hardware blocks are primarily introduced : the Decompressor and the Compactor. The decompressor is the block that converts scan in pins to multiple internal chain pins ; the compactor does the opposite operation. The compressed scan chains are called channels.
CoDec is the name given to Compactor-Decompressor. EDT stands for Embedded Deterministic Test. The embedded logic includes a decompressor located between the external scan channel inputs and the internal scan chain inputs, and a compactor located between the internal scan chain outputs and the external scan channel outputs.
The cons of compression are Lower Test Coverage ,pattern Inflation and Routing Congestion ; thus there is a limit till what a design can be compressed.
Lets take an example of a design that has 1000 scan elements (flip-flops) and 10 scan-in pins and scan-out pins each.
So for a standard non-compressed design we will has 10 scan chains with 100 flops (1000/10) in each chain as shown below.
But if we consider the same design to be compressed by a factor of 10x then there are 100 internal channels ; and each channel has 10 flops (1000/(10x10)) each in a chain. The extra cost paid is of course the EDT hardware that are introduced.
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Another important terminology used here is “Compression Ratio†which is defined as the?ratio of number of? scan chains to the number of scan channels.
Source:
- CMOS VLSI Design: A Circuits and Systems Perspective by Weste & Harris
- Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by Bushnell & Agrawal
- Semicon Shorts
etc
M.Sc. Electrical Engineering
1 个月Hi, thanks for sharing and I have a question. In compressed scan mode, how can we get 10 scan in ports to 100 scan inout ports through decompressor and vice versa?
Design For Test
2 个月What are the defects stuck at fault won't detect