Wavefront Sensing News #1

Wavefront Sensing News #1

Welcome to Wooptix's Newsletter, where we share the lastest updates in wavefront world. Get ready!

WFPI in Silicon Semiconductor

Javier Elizalde, Chief Operations Officer at Wooptix, discusses the company’s Wavefront phase imaging innovation, a new semiconductor metrology technique for measuring wafer geometry, designed to capture millions of datapoints in a few milliseconds with sub-nanometer height accuracy and higher spatial resolution than any other techniques.



Wooptix in Semicon Europa

At Semicon Europa, Wooptix will present at the Advanced Packaging Conference (APC), in Munich (Germany), its latest solution for on-product overlay for wafer-to-wafer bonding processes.



TSMC will train 100 Students by Year

The German State of Saxony and Taiwan Semiconductor Manufacturing (TSMC), one of the world’s largest manufacturers of microchips, announced the signing this Tuesday of a memorandum of understanding to train German university students in Taiwan in the details of the microchip industry.



High-Precision Optical Metrology

Optical metrology is the science of making precise measurements using light-based techniques. It enables non-contact characterization and inspection across diverse fields, including semiconductor fabrication, nanotechnology research, biomedical imaging, precision manufacturing, and scientific studies. This article overviews key optical metrology techniques, their technical principles, and leading technology providers.

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