Thin Film Metrology Systems Market Estimated to Grow With Rising Application of Technology
The thin film metrology systems market has been projected to grow at a significant pace in the coming years. These novel growth opportunities in the global market are owing to the increasing scope of the application in the measurement of the thin film parameters, for instance, stress, thickness, and resistivity. In addition to this, rising demand for the miniaturization of semiconductors has also been predicted to create growth opportunities in the thin film metrology systems market in the near future.
The accuracy ensured through the use of the technology from the thin film metrology systems market is likely to create demand avenues in the following years. Transparent films, thick films, and opaque films are the prominent types of the thin film metrology systems that are used around the world. It is a very popular technology in the thin film metrology systems market because of its high accuracy and low cost. Further, sound waves are used in opaque films metrology to measure the thickness of the film. The duration of time between echo detection and sound induction is directly proportional to film thickness.
Key Technologies in Thin Film Metrology Systems Market
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KLA-Tencor, Nanometrics, Nova Measuring Instruments, Rudolph Technologies are some of the key players identified by the report in the global thin film metrology systems market. Other prominent vendors are Hitachi High-Technologies, SCREEN Holdings, and Semilab.
Author:
Pooja Gavali
Semiconductor & Electronics,
TMR Research