smartWLI + 20x objective for high performance roughness measurement
It is an powerful combination for roughness measurements:
- you can measure larger areas with a single scan
- you still have sub nano meter z resolution
- with an density of independent measuring points up to 0.35 μm you see already much more details than with a stylus tip (4 μm diameter)
- slopes as shown on the 45° cutting edge can still be scanned with the smartWLI's using the 20x objective
Shown is the center of a 3D Siemens star measured with an 20x objective. The zoomed partial area shows the excellent result down to the last measuring point. Unfortunately our target hasn't a ideal shape. It isn't easy to get perfect standards - but easy to get more details with a high resolution objective:
The 100x scan just confirms the 20x results and that you still get sub nano meter resolution with lower magnification. A big benefit since confocal microscopes and focus variation would generate an extreme higher noise level (confocal app. 80x higher, focus variation app. 400x higher noise with an 20x objective - but please check this on the homepage of the manufacturer) and therefore gives you trouble to measure values as Rz correctly.
Last but not least the data acquisition can be done with up to 500 f/s and 100 μm/s. It takes just ms to scan surface structures. This is a huge benefit an stops the impact of vibrations on inline installation and mobile measurements, where anti-vibration tables cannot be used.
Skeptical? Just published from Bruker Alicona was he statement, that WLI's have trouble with rough surfaces. Ok. Some devices may have troubles. Our devices don't have same:
Shown is the selection of an 45° flank of an insert.
We don't recommend this for roughness measurements. The perspective could change the values - but you still get measured the details of the grinding correctly even on an 45° flank.
