Phase imaging and synthetic aperture super-resolution via total internal reflection microscopy

Phase imaging and synthetic aperture super-resolution via total internal reflection microscopy

Guillaume Maire, Hugues Giovannini, Anne Talneau, Patrick C. Chaumet, Kamal Belkebir, and Anne Sentenac

https://doi.org/10.1364/OL.43.002173

Total internal reflection microscopy is mainly used in its fluorescence mode and is the reference technique to image fluorescent proteins in the vicinity of cell membranes. Here, we show that this technique can easily become a phase microscope by simply detecting the coherent signal resulting from the interference between the field scattered by the probed sample and the total internal reflection. Moreover, combining several illumination angles permits generating synthetic aperture reconstructions with improved resolutions compared to standard label-free microscopy techniques.