Optoprofiler LLC has joined SEMI

We are happy to announce that we have joined SEMI.

Optoprofiler LLC is the manufacturer of Optoprofiler 200 an interferometric tool for wafer thickness, topography, and internal structure metrology. Optoprofiller LLC also provides solutions for high aspect ratio structures (TSV, deep trenches, bumps) metrology, and scatterometry solutions for roughness metrology for semiconductor and photonics industries (light diffuser metrology).

In addition, Optoprofiler is representing Chipmetrics and its ALD metrology solutions. For more information please visit us at the Optoprofiler LLC website, email us at [email protected], or call us at (267) 626 3075.