Optimization of Testing Processes: An Analysis of Test Sequencer and Test Profiler

In today’s industrial landscape, ensuring the quality and performance of tested devices is paramount. To achieve these objectives, companies rely on advanced systems like Test Sequencers and Test Profilers - tools that streamline testing procedures, improve assessment accuracy and ensure reliable results.

Test Sequencer and Test Profiler: A Comparison

Test Sequencer

A Test Sequencer is a system designed to execute predefined test sequences on Devices Under Test (DUTs). Each sequence comprises a series of programmable actions, such as powering the device on and off, adjusting operating parameters, or performing specific measurements. This system is particularly useful in scenarios that require automation of repetitive or complex tests, reducing human intervention and increasing efficiency.

Applications of a Test Sequencer:

• Functional Testing: Verifying proper device operation through sequences of activations and deactivations.
• Reliability Testing: Performing tests to assess operational durability and resistance to varying conditions.
• Process Automation: Reducing cycle times and standardizing testing procedures.

Test Profiler

Conversely, a Test Profiler focuses on analyzing the dynamic behavior of devices under varying operational conditions. Using torque and speed profiles, the system simulates real-world scenarios to evaluate performance over time. A Test Profiler gathers critical data through integrated sensors, providing detailed insights into DUT response during endurance testing.

Applications of a Test Profiler:

• Long-Term Testing: Analyzing device performance over extended periods, simulating extreme or prolonged conditions.
• Stress Testing: Assessing device resilience under intense loads and operational conditions.
• Product Optimization: Identifying improvement areas through data analysis collected during tests.

Bytelabs Solutions: SPOT and PATH

Bytelabs has leveraged its extensive experience in test automation to develop two innovative solutions: SPOT and PATH. These systems not only optimize testing processes but are also designed to integrate seamlessly with advanced technologies offered by National Instruments, particularly cDAQ and cRIO systems.

SPOT: Test Sequencer (Sequence Plugin Optimize Test)

SPOT is a Test Sequencing platform that enables users to manage and automate tests on a wide array of devices. With its intuitive and customizable interface, SPOT allows users to create detailed test sequences, adapting to specific operational needs. Key features include:

• Hardware Compatibility: Native integration with National Instruments’ DAQmx drivers, ensuring broad versatility.
• Advanced Automation: Manages test phases with integrated reporting, facilitating data analysis.
• Process Standardization: Enables adoption of uniform testing protocols, enhancing result consistency.

PATH: Profiler for Accuracy Testing and Hardiness

PATH is a Profiler designed for durability and endurance testing. Tailored for cRIO systems, this tool enables precise management of torque and speed profiles, facilitating the execution of complex cyclic tests. Core functionalities include:

• Real-Time Management: Continuous operational data analysis through integrated sensors, offering dynamic performance monitoring.
• Cyclic Testing Execution: Allows replication of real-world operating scenarios, enhancing result validity.
• Integration with Advanced Technologies: Compatible with both cDAQ and cRIO systems, optimizing test procedures.

Benefits

The SPOT and PATH solutions offer several significant advantages:

• Complete Application: These platforms provide a finished system that eliminates the need for additional licenses. Users gain access to all features without extra costs, simplifying the implementation and management of testing operations.
• Reduced Programming Requirements: Thanks to their user-friendly interfaces and intuitive design, SPOT and PATH significantly reduce the programming workload. Technicians can focus more on analysis and test optimization rather than complex code development.
• Integration with the ByteQX Suite: Both platforms are designed to seamlessly integrate with the ByteQX suite, providing a cloud-based ecosystem for centralized, shared, and standardized data analysis. This approach enhances team collaboration and facilitates access to test data, ensuring a comprehensive and detailed view of device performance.