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Nanoscale IR Microscopy and Spectroscopy

NT-MDT Spectrum Instruments

Atomic Force Microscopy for Nanotechnology, Scientific Research & Education

发布日期: 2017年9月19日

NT-MDT SI is happy to present a unique system which combines latest developments in AFM and s-SNOM techniques, called NTEGRA Nano IR – the most advanced system for Nanoscale IR Microscopy and Spectroscopy.

In this webinar we will show how the combination of low thermal drift and low noise AFM with s-SNOM IR helps to obtain perfect high resolution results on various samples. Webinar will take place on

Wednesday, October the 11th 4:00-5:00 PM BST

(check your local time zone on REGISTRATION PAGE)

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