Mechanically scanned interference pattern structured illumination imaging

Mechanically scanned interference pattern structured illumination imaging

Jarom Jackson and Dallin Durfee

https://doi.org/10.1364/OE.27.014969

?We present a fully lensless single pixel imaging technique using mechanically scanned interference patterns. The method uses only simple, flat optics; no lenses, curved mirrors, or acousto-optics are used in pattern formation or detection. The resolution is limited by the numerical aperture of the angular access to the object, with a fundamental limit of a quarter wavelength and no fundamental limit on working distance. While it is slower than some similar techniques, the lack of a lens objective and simplification of the required optics could make it more applicable in difficult wavelength regimes such as UV or X-ray.