Maximizing Reliability of LIGO Sensor Through Burn-in Testing

The electronic devices used in industrial and automotive share a common expectation of “working reliably". Devices must perform their intended function for an expected period under all possible environments encountered in the field. Intermittent operation and poor performance are included in assessing a system’s failure rate. A high failure rate is unacceptable under any circumstance.

"Field failures can lead to costly repairs, product recalls, and customer dissatisfaction which will harm both the bottom line and the viability of a manufacturer."

The bathtub curve is a result of the limitations of manufacturing processes and equipment capabilities implemented in the fabrication of the device. A high early failure rate results from uncontrollable anomalies that occur during the manufacturing process, In the mid-life of a product the failure rate is constant. In the later life of the product, the failure rate increases due to wear out.

In response to this expectation, SOJI Electronics has developed ways to enhance the probability of delivering the highest possible reliability to the end-user. Perhaps the best approach to achieve this goal would be to perform a short but enhanced test case of the device in the actual field stress environment, essentially validating the performance signature of the field conditions.

The Burn-in testing system is developed for LIGO sensors to simulate the sensor's operation under actual operating conditions and measure parameters (current, power consumption, temperature, capacitance, etc.) in 48 hours.

Burn-in is, however, only one step in a systematic approach to ensure product reliability. True continuous process improvement to drive reliability is organizational culture. Testing will not guarantee a quality product since testing only finds problem effects. Real quality is driven by raw material quality, fabrication process control, design guideline limitation rules, and experience.

However, burn-in testing remains one of the keystones for providing statistically driven confidence in many aspects of semiconductor manufacturing. Burn-in testing enables the manufacturer historical confidence in process control, an ability to monitor and benchmark process or technology changes, and provides a pedigree certificate for convincing customers of the reliability assurance their products carry. Burn-in testing performance results may well be the “permission to play” credential for the markets of tomorrow.

Written by Quang Nguyen - CEO of SOJI Electronics

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