Making Solid Judgments of the Robustness of IoT Devices Used for Different Mission Profiles

EOS/ESD Association, Inc. is sponsoring the 42nd Annual Symposium on Electrical Overstress (EOS) and Electrostatic Discharge (ESD) effects and the IOT Robustness Workshop at the Peppermill Resort and Casino in Reno NV, September 13-18, 2020.

Continually growing and expanding IoT applications need semiconduc-tor devices which have been developed for a variety of applications.. Examples include a 5G base-band IC or an AI accelerator, which can end up in very harsh ambient conditions. A dedicated de-sign would both delay the innovations and not be economically feasible for lower volume parts.

The challenge is to establish methods to make a solid judgment of the robustness of this device used for the different mission profiles.

 The 3rd Annual Workshop on Robustness of IoT Devices is a dedicated program within the Symposium for addressing topics such as this and is scheduled for September 16 – 17, 2020. Technical paper presentations will include: 

MEMs Robustness in IOT Applications - MEMs sensors are becoming ubiquitous in IOT devices. This paper focusses on the sensor sensitivity and robustness requirements involved in different applications and the design tradeoffs associated with these competing forces. 

Transient Pulse Characterization for IC and Modules - Considering the versatility of IoT device applications the robustness testing of IoT ICs and modules must be revisited. The presentation discusses real world examples and proposes an efficient method for transient stress testing at module and board level. 

Reliability and IoT Devices: IoT Mission Profiles, Design Challenges, and Methods - As IoT proliferates throughout the public domain into automobiles, factories, and buildings, reliability of these IoT devices must also scale. A fundamental aspect of reliability is that the device must support the mission profile. The talk provides the key aspects how IoT device mission profiles is integrated into a design strategy. 

Walking Wounded Loophole in System Level ESD Qualification - “Walking wounded” are parts that have been damaged but are not detected as failures. Component-level ESD qualification results detect failures of functional FPGAs. Contrarily System-level ESD Qualification with JTAG detect no failures of the same FPGA. A proposal is made to match component and system-level pass/fail criteria. 

AND MANY OTHER PRESENTATIONS!!  For information on the many other IoT Workshop Technical presentations that will be offered, please visit the EOS/ESD Association website at: https://www.esda.org/