Great discussions and cutting-edge research at the Future Days Semiconductor edition

This event gathered distinguished industry experts and our in-house semiconductor specialists to delve into the fascinating world of crystal engineering.

It featured enlightening discussions on the latest innovations, focusing on the essential tools within the magic triangle of processing, simulation, and metrology. Thanks to our invited experts from PVA TePla AG and STR - Semiconductor Technology Research (STR) for the fascinating talks!

2024 edition

• Growth of SiC Single Crystals in Large Scale R&D Initiatives – Advances, Challenges, and Opportunities
• How Crystal Orientation Metrology Supports Development of SiC Super Junction MOSFETs
• Latest Advancements in PVT SiC Crystal Growth Using Computer Modeling
• Silicon Carbide Crystal Growth Equipment for the Semiconductor Industry
• Using modeling to address challenges in CVD growth of SiC epilayers for frontend use
• Crystal orientation process support from seed to wafer

2023 edition

From advanced silicon solutions for MEMS, RF, and power electronics applications, to power GaN technology for mainstream applications and connected metrology for characterizing complex layer stacks, we covered a wide range of topics during our last edition. We also discussed how to optimize XRF wafer metrology on a system and fab level, and presented new XRD solutions from lab to fab.

• Find out how silicon is still pushing boundaries in advanced applications
• Discover the everyday applications of cutting-edge technology
• Unleash the power of connected metrology in semiconductor manufacturing
• Optimize XRF wafer metrology at system- and fab-level
• New XRD solutions from lab to fab

Watch the recordings

Let us know which topics you want us to cover during our next edition.