Gather conditioning using Lumina software

As a follow up to my post last week, I thought I would show an example of gather conditioning using the Lumina software. On the left is an example of a standard, run-of-the-mill offset gather from one of the major processing shops in Houston. In the middle is my version of the gather after using the Lumina software. Notice how the energy distribution throughout the gather has not changed, i.e. I have not 'created' any new anomalies, but what I have done is flatten the events and removed noise. This is how you improve stacks and get a better AVO response, which makes the interpretation so much better. With the improved data, you also get the benefit of getting better results from Lumina's high-end processes, such as sparse layer inversion (Lumina's version of bandwidth extension, which is a model-based approach that incorporates the Widess tuning thickness to avoid discriminating against thin beds), phase and spectral decomposition, fault tracking, etc.

On the right is the offset gather converted to angles. As an interpreter, I'll take the angle gather over the offset gather every time. When was the last time a contractor offered you angle gathers? Because the gather is now incremented in even increments, the AVO analysis gets better results. If you don't believe that, take a look at your own offset gathers and you might notice the spacing between traces varies.

If you find this interesting, give me a call at 713-301-7070 or send me a private message.