The Future of Semiconductor Inspections
GEA of Texas, Inc.
High-technology distributor of industrial automation components and solutions.
Check Out Our Video Overview!
We’re excited to introduce the Omron SWIR Camera, a cutting-edge technology designed to elevate your industrial inspections. Check out our latest?demo video?showcasing how this camera performs real-time inspections on semiconductor wafers!
See how the Omron Automation SWIR Camera detects wafer defects and contamination that traditional cameras often miss.
Why Choose the Omron SWIR Camera?
Wide Sensitivity Range:?Captures wavelengths from?400nm to 1700nm, combining visible light and SWIR for a more comprehensive inspection.
Advanced Cooling Technology:?Thermoelectric cooling element for stable and high-quality imaging.
Dual Imaging:?No need for multiple cameras—perform both visible and SWIR imaging in one device.
Fast & Efficient:?High frame rates and multiple interface options for seamless integration into your workflow.
Key Applications for the SWIRCamera
Semiconductor Inspections:?Detect defects and contamination on wafers.
Package Integrity:?Check contents and packaging for defects without opening.
Agriculture:?Inspect fruits and vegetables for freshness and damage.
Liquids & Materials:?Analyze transparency, volume, and detect leaks in liquids.
Message Our Expert Nick Vargo
Our Partnerships
Ready to Integrate the Omron SWIR Camera?
Contact Us Today!
Ready to revolutionize your inspections? Reach out for a personalized consultation.
Our vision expert, Nick Vargo: [email protected]