Design For Testability, DFT

While testing any ASIC product occurs at the end of manufacturing cycle, the test could have far more implications on the return of the investment than originally planned.

A successful ASIC product which returns the investment has to meticulously budgeted for cost of every phase of its life cycle.

ASIC life cycle can be comprised of, product concept, ASIC requirements, design, manufacturing, and test.

Testing ASIC is the very last step in manufacturing before ASIC is shipped out the door, yet if testing methodology and requirements are not considered during the product concept, it could cost more or triggers many returns by the customers.

ASIC test cost is significant portion of overall budget and has to be carefully monitored.

To reduce the AISC cost and increase margin, the testing capability has to be studied and designed in such a way that it minimizes the testing time.

Minimizing ASIC test time is a challenging task which puts technical requirements on the ASIC design.

Design For Testability, DFT applies to highly complex ASIC which return the investment by taking into account testing methodology right up front in the design phase.

Many companies which did not integrate for DFT in their product life cycle, have fallen short in returning the investment.

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