China Patent Practice of TJIP for Detecting Device Application

The application is rejected because the examiner considers that the claim 1 of the filing application does not involve an inventive step in light of the citation. However, TJIP reviews the technology difference between the citation and the filing application. The filing application provides a method for detecting defect points in the adhesive layer of the fibre cloth by simultaneously detecting an upper surface and a lower surface of the fibre cloth with two detectors. The citation provides a method for detecting defect in electric wire by sensing partial discharge with one detector. Finally, TJIP convinces the examiner by analyzing and specifying the technology difference between the citation and the filing application. The filing application is granted.