Article II: The Impact of TID (Total Ionizing Dose) Radiation Performance on IRF740PBF COTS
The purpose of this test was to characterize performance changes in the Devices Under Test (DUT) due to the effects of Total Ionizing Dose (TID). The scope is to evaluate how the subjected devices perform once exposed to Cobalt-60 gamma photons at various increasing levels of exposure.
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?SUMMARY/CONCLUSION
Samples were electrically characterized after exposure to customer specified levels. All tests were performed in conformance with the conditions and requirements described by MIL-STD-750/883 Test Method 1019. VPT Rad has DLA Laboratory Suitability for this test method. Samples were tracked in process using a TRAVELER, found in Appendix C. VGS Devices Under Test (DUT) began missing test specification limits at 10krad and suffered functional failures post 20krad. VDS DUTs passed all test specifications through 20krad. Please see Appendix B for detailed data results. Click the link to visit our website to download the full report or contact VPT Rad to learn more!