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yieldWerx Semiconductor

yieldWerx Semiconductor

半导体制造业

Plano，Texas 8,361 位关注者

Semiconductor test data & yield analytics, enabling better decision making & root cause analysis

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关于我们

yieldWerx offers end-to-end semiconductor test data analytics solutions, enabling better decision making, root cause analysis, and process improvement. Our products support semiconductor engineers all the way from initial device characterization, to automated yield and quality management and finally RMA analysis. yieldWerx enables product and test engineers with the tools and technologies necessary to characterize new ICs and test programs, speedily ramp up production at OSATs and identify and diagnose yield excursions. yieldWerx Automotive Solutions offer a comprehensive solution for Part Average Testing, in compliance with AEC (Automotive Electronics Council) specifications, managing the complete outlier removal process from initial wafer lot characterization to final-test yield monitoring. yieldWerx Automotive Solutions are used in production by major semiconductor companies around the world, and is deployed at major OSATs and test houses, to assist in improving the quality of devices used in safety-critical automotive applications. yieldWerx PAT’s outlier algorithms, and modules (SPAT, DPAT, Multivariate PAT, GDBN, etc.) help semiconductor manufacturers minimize their PAT yield loss, quickly identify process shifts, and gain greater control of their chip manufacturing process. yieldWerx solutions are built on the Microsoft .Net architecture, making your yield and quality management activities scalable as your business grows. yieldWerx supports standard semiconductor test data files like STDF, PCM and hundreds of other formats. For more information, visit us at www.yieldwerx.com

网站
https://www.yieldwerx.com
所属行业
半导体制造业
规模
51-200 人
总部
Plano，Texas
类型
私人持股
创立
1985
领域
Semiconductor Yield Monitoring Software、Semiconductor Test Data Analytics、STDF、Wafer Map、ATE、Part Average Testing (PAT)、Statistical Process Control (SPC)、yield analysis、manufacturing data analysis、YMS、yield management、automotive semiconductor、root cause analysis、outlier detection、AI、ML、Big Data、Wafer Map、Wafer Analysis、Semiconductor Test Data和STDF

地点

  • 主要

    8105 Rasor Blvd

    Suite 200

    US，Texas，Plano，75024

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