?? Congratulations to Carlos Armenta from New Mexico State University for winning the Outstanding Oral Presentation award at the AVS 70th Symposium & Exhibition in Tampa! ?? Carlos’s presentation, "Modeling Many-body Effects in Ge Using Pump-probed Femtosecond Ellipsometry," highlights the effects of different carrier concentrations on materials optical properties using pump-probed Femtosecond ellipsometry. J.A. Woollam Co. is proud to invest in the futures of students, empowering the next generation of scientists to push the boundaries of technology and innovation. ???? #AVS70 #Ellipsometry #JAWoollamCo #ScienceInnovation
关于我们
The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the J.A. Woollam Company has rapidly grown to become a worldwide leader in spectroscopic ellipsometry. We have been perfecting our technology for over 30 years and have secured over 190 patents.
- 网站
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https://www.jawoollam.com
J.A. Woollam的外部链接
- 所属行业
- 研究服务
- 规模
- 51-200 人
- 总部
- Lincoln,NE
- 类型
- 私人持股
- 创立
- 1987
- 领域
- Spectroscopic Ellipsometers和Thin Film Characterization
地点
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主要
311 S 7th St.
US,NE,Lincoln,68508
J.A. Woollam员工
动态
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It’s been an incredible week at the AVS International Symposium & Exhibition in Tampa! We were honored to participate in such a dynamic event filled with engaging talks, insightful poster sessions, and inspiring symposium presentations. A special congratulations to Alex Bordovalos, this year’s J.A. Woollam Co.’s scholarship recipient! His innovative work on custom neural networks for ellipsometric data interpretation is truly advancing the field. Thank you to everyone who visited our booth, connected with us in sessions, and shared your research. We’re proud to support the brilliant minds driving the future of materials science! #AVS2024 #JAWoollam #MaterialsScience #Ellipsometry #ScholarshipWinner
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Register Now to Explore the Future of Thin-Film Characterization with Spectroscopic Ellipsometry! Are you a researcher or engineer looking to advance your knowledge and skills in thin film analysis for product R&D? If so, this webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization on R&D Applications of Spectroscopic Ellipsometry. In this episode, Dr. Jianing Sun explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials ?? Key topics include: -Fundamentals of spectroscopic ellipsometry -Its unique advantages and potential limitations -Real-world case studies and applications in R&D -In-situ and dynamic ellipsometry techniques ???? Meet our Speaker: Jianing Sun, PhD, Applications Engineer, J.A. Woollam Co. Dr. Jianing Sun has been with J.A. Woollam Company since 2008, with over 16 years of experience in developing ellipsometry techniques for thin-film research, particularly in semiconductors and materials science. She holds a Bachelor’s and Master’s in Chemical Engineering from Tsinghua University and a PhD in Materials Science and Engineering from the University of Michigan. Learn how ellipsometry provides vital insights for real-time process control and property monitoring. ?? Date: October 17th, 2024 | 11AM PT ?? Register here: https://lnkd.in/g-G54HDY Don’t miss out—register today and share with your network!
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?? T-minus ONE WEEK! Don’t wait—apply today and take the next step in your educational journey by applying for the J.A. Woollam Company Scholarship through the Society of Vacuum Coaters Foundation! Deadline is Oct. 18th.
There is one week left to apply for the Society of Vacuum Coaters Foundation (SVCF) academic scholarships. One of those scholarships is the J.A. Woollam Company Scholarship. In 2017, the J.A. Woollam Company endowed a scholarship through the SVC Foundation to encourage young students in their path toward education in fields involving vacuum coating technologies.?Since inception, this Scholarship has been made available to 17 students and we look forward to continuing to help impact the lives of many students in the future! Society of Vacuum Coaters (SVC), SVC Young Members Committee, #Ellipsometry, #ThinFilms, #VacuumCoatings, #Metrology, #Semiconductors Daniele Benetti, Shane Arlington, Ph.D., Niva Jayswal, PhD, Rachel Nye, Krishnanand Shukla (????????? ?????) CSci. MiMMM, Demetris Soukeras, Kamal Rudra, Sarah Nahar Chowdhury, Swetapadma Sahoo, Aleksandra Paj?k, Omer Yesilyurt, Gareth Bellinger, Lina Rojas, Rezoana Bente Arif, Julien Decker
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J.A. Woollam转发了
???? ?????? ???????? ???????? ???????? ??????????, ???????? ?????????????????? ???????????? ???????????????????? ???? ???? ???????? ??????????! ?? Spectroscopic Ellipsometry is a non-destructive optical technique used for precise characterization of #thin-films and coatings ranging from sub-nanometer up to 10s of microns thick! In Covalent Academy's next webinar event, guest speaker Dr. Jianing Sun from J.A. Woollam will catch you up with some of the latest applications of Ellipsometry across industries including #semiconductors, #biotech, #displays, and more! Come learn the principles of this technique and find out why its popularity in R&D has been growing so rapidly in recent years. ???????????????? ??????: https://bit.ly/4gXj6SX
R&D Applications of Ellipsometry | Covalent Metrology
https://covalentmetrology.com
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J.A. Woollam转发了
? ?????????????? ?????? ?????????????????????? ?????? ?????????????????? ?????????????? ???????? ???????? ??????????? You won't want to miss our upcoming webinar event, in partnership with J.A. Woollam. This talk delves into ?????????????????????????? ????????????????????????, a cutting-edge optical technique revolutionizing thin-film characterization for R&D. You'll learn how the technique works, its advantages and limitations, and get to see real examples and case studies of its industry R&D applications, including in-situ and dynamic ellipsometry techniques! Discover how Ellipsometry can unlock critical insights for real-time process control and property monitoring. Register to join us at: https://bit.ly/4ev0mbR
R&D Applications of Ellipsometry | Covalent Metrology
https://covalentmetrology.com
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J.A. Woollam转发了
24th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop at the The University of Manchester This annual free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. Application engineers from J.A. Woollam are giving talks on the following topics: - Theory - Applications - Products - Demonstration - .J A. Woollam alpha-SE Ellipsometer #Ellipsometry?#Ellipsometers?#JAWoollam?#QDUKI?#QuantumDesignUKandIreland?#SpectroscopicEllipsometry?#WoollamWorkshop
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J.A. Woollam转发了
This week I had this chance to attend Ellipsometry workshop in Manchester University held by J. A. Woollam " Industry leading Ellipsometer for thin film characterization" It was great experience to learn more about equipment, meet experts in this field and get to know new techniques for modelling thin film thickness Special thanks to Dr. Shayz Ikram and Angela Carslake for organising this wonderful event.
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Our J.A. Woollam Applications Engineers are visiting our partners at Linkam, global leaders in temperature control technology. Together, we’re advancing temperature-dependent characterization of thin films, measuring both thickness and refractive index using Linkam temperature stages integrated with our spectroscopic ellipsometers. #SpectroscopicEllipsometry #ScientificCollaboration #JAWoollam #Linkam #AdvancedResearch