J.A. Woollam

Join J.A. Woollam Co. at SPIE Advanced Lithography + Patterning 2025! We’re excited to be at SPIE Advanced Lithography + Patterning this week, showcasing our latest ellipsometry solutions for lithography and thin film metrology! Stop by Booth 312 to see how our spectroscopic ellipsometers provide high-precision measurements for process control, resist characterization, and multilayer film analysis. ?? Why visit our booth??? Connect with our application engineer, Ron Synowicki, to discuss your lithography metrology challenges?? Explore real-world applications of ellipsometry in semiconductor manufacturing?? Get insights into how our tools can improve accuracy and efficiency in your process ?? Where? The San Jose McEnry Convention Center??? When? Feb 23-27? ?? Don't miss this opportunity to explore the latest advancements in optical metrology! #SPIELitho #Metrology #Ellipsometry #JAWoollamCo #Lithography

Ron Synowicki will be leading an online course, “Introduction to Spectroscopic Ellipsometry” on March 5th (10:00AM-5:00PM ET) under the AVS National Online Short Course Program. The full program will offer seven?different?AVS Short Courses, March 4-14, 2025, with qualified instructors via Zoom. ??This course is perfect for anyone eager to explore the fundamentals and practical applications of ellipsometry, taught by an industry expert. ??Course Objectives: ??Understand the analytical measurement technique called Spectroscopic Ellipsometry ??Learn about measuring the thickness and optical functions of very thin films. ??Understand concept of polarized light and method of describing optical functions. ??Determine the thickness and optical functions of a very thin film using spectroscopic ellipsometry. Secure your spot now by clicking the registration link below! https://lnkd.in/dxpZRRnR #Ellipsometry #AVS #OnlineCourse #ScienceEducation #JAWoollamCo

?? The J.A. Woollam Co. Annual Newsletter, Issue #24, is Now Live! The wait is over! We’re excited to announce that the 24th issue of the J.A. Woollam Co. Annual Newsletter is now available! Packed with the latest advancements in spectroscopic ellipsometry, company milestones, and research insights, this issue is a must-read for anyone in the field. ?? Check it out now! ?? https://lnkd.in/eWyekwh Table of Contents: ??? 04 – About Our Company ??? 06 – The Wavefront: Cutting-Edge Applications Using Spectroscopic Ellipsometry? ?? 08 – ICSE-10: Making Waves in the Midwest? ?? 12 – Celebrating Thirty Years with J.A. Woollam Japan? ?? 16 – Artifact Minimization and Interference Enhancement? ?? 22 – Optical Critical Dimension Metrology with Spectroscopic Ellipsometry? ?? 28 – Featured Researcher: Rüdiger Goldhahn? ?? 36 – The Power of the Gen-Osc: New Dimensions? ?? 42 – Advances in Infrared Ellipsometry: Enhancing Capabilities Through Advanced IR Techniques? ?? 45 – Employee Spotlights? ?? 46 – J.A. Woollam Company Scholarship Recipients? ?? 48 – Former Scholarship Recipient: Kamal Rudra? ?? 49 – Featured Industry Partner: Covalent Metrology? ?? 50 – Worldwide Sales & Support? ?? 51 – Schedule of Events ?? Each article showcases innovations and expertise that continue to push the boundaries of spectroscopic ellipsometry. ?? Read it now! ?? https://lnkd.in/eWyekwh #JAWoollamCo #Ellipsometry #SpectroscopicEllipsometry #Newsletter #Research #Innovation #thinfilms #ThinFilmAnalysis #CovalentMetrology #opticsandphotonics #optics #worldwideleadersinSE #artifactminimization #makingwavesinthemidwest #ICSE10 #infrared #infraredimaging #featuredresearcher #irtechniques #SEconferences #jawco

The J.A. Woollam Applications Engineers are at the exhibition booths this week, ready to answer your spectroscopic ellipsometry questions. Whether you’re curious about a specific application or just exploring the field, stop by to connect with our experts! ? Photonics West, Booth 3561: Learn how our ellipsometers can enhance your optical coating and photonics research. Bring your questions, and let’s discuss solutions tailored to your needs. ? AR/VR Booth 6312 : Discover how spectroscopic ellipsometry can support the development of advanced optical devices for augmented and virtual reality. Stop by to explore how we can help characterize your materials. We look forward to seeing you!

Warmest wishes for a happy holiday season and a wonderful New Year! From, Your Friends at J.A. Woollam Company

?? Congratulations to Carlos Armenta from New Mexico State University for winning the Outstanding Oral Presentation award at the AVS 70th Symposium & Exhibition in Tampa! ?? Carlos’s presentation, "Modeling Many-body Effects in Ge Using Pump-probed Femtosecond Ellipsometry," highlights the effects of different carrier concentrations on materials optical properties using pump-probed Femtosecond ellipsometry. J.A. Woollam Co. is proud to invest in the futures of students, empowering the next generation of scientists to push the boundaries of technology and innovation. ???? #AVS70 #Ellipsometry #JAWoollamCo #ScienceInnovation

It’s been an incredible week at the AVS International Symposium & Exhibition in Tampa! We were honored to participate in such a dynamic event filled with engaging talks, insightful poster sessions, and inspiring symposium presentations. A special congratulations to Alex Bordovalos, this year’s J.A. Woollam Co.’s scholarship recipient! His innovative work on custom neural networks for ellipsometric data interpretation is truly advancing the field. Thank you to everyone who visited our booth, connected with us in sessions, and shared your research. We’re proud to support the brilliant minds driving the future of materials science! #AVS2024 #JAWoollam #MaterialsScience #Ellipsometry #ScholarshipWinner

Register Now to Explore the Future of Thin-Film Characterization with Spectroscopic Ellipsometry! Are you a researcher or engineer looking to advance your knowledge and skills in thin film analysis for product R&D? If so, this webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization on R&D Applications of Spectroscopic Ellipsometry. In this episode, Dr. Jianing Sun explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials ?? Key topics include: -Fundamentals of spectroscopic ellipsometry -Its unique advantages and potential limitations -Real-world case studies and applications in R&D -In-situ and dynamic ellipsometry techniques ???? Meet our Speaker: Jianing Sun, PhD, Applications Engineer, J.A. Woollam Co. Dr. Jianing Sun has been with J.A. Woollam Company since 2008, with over 16 years of experience in developing ellipsometry techniques for thin-film research, particularly in semiconductors and materials science. She holds a Bachelor’s and Master’s in Chemical Engineering from Tsinghua University and a PhD in Materials Science and Engineering from the University of Michigan. Learn how ellipsometry provides vital insights for real-time process control and property monitoring. ?? Date: October 17th, 2024 | 11AM PT ?? Register here: https://lnkd.in/g-G54HDY Don’t miss out—register today and share with your network!

?? T-minus ONE WEEK! Don’t wait—apply today and take the next step in your educational journey by applying for the J.A. Woollam Company Scholarship through the Society of Vacuum Coaters Foundation! Deadline is Oct. 18th.

???? ?????? ???????? ???????? ???????? ??????????, ???????? ?????????????????? ???????????? ???????????????????? ???? ???? ???????? ??????????! ?? Spectroscopic Ellipsometry is a non-destructive optical technique used for precise characterization of #thin-films and coatings ranging from sub-nanometer up to 10s of microns thick! In Covalent Academy's next webinar event, guest speaker Dr. Jianing Sun from J.A. Woollam will catch you up with some of the latest applications of Ellipsometry across industries including #semiconductors, #biotech, #displays, and more! Come learn the principles of this technique and find out why its popularity in R&D has been growing so rapidly in recent years. ???????????????? ??????: https://bit.ly/4gXj6SX