Bruker Nano Surfaces & Metrology

Building on 55 years of surface measurement innovation and technology leadership, Dektak Pro? sets a new standard for stylus profilometer performance. The system uniquely delivers the highest quality data with unrivaled ease of use. ?? https://lnkd.in/gaMM2DbF ???????? ????????-???????????????????? ????????????? ???????????? ????????????????: ? Unmatched accuracy and better than 4 A repeatability ? Accelerated measurement and analysis speed ? A suite of Bruker-exclusive versatility and ease-of-use features Only Dektak Pro provides the latest stylus profilometry advances and reliability needed to support your cutting-edge research and industrial applications well into the future. #Microelectronics #Biomaterials #thickfilms

?????????????????? ?????? ???????????????????? ???????????????????? ?????? ?????????????????????????? ???????? ???????? ?????????????? ???????????????????????? ?????????????? ???????????? ???? ???????????????????????? ?????????????? ????????????. Bruker’s John Wall (Compound Semi Business Product Manager) was quoted in the recent Semiconductor Engineering ?????????????????? ???????????????? ???????? ???? ???? ??????-2???? ???????????? ???????? ??????????: “… the [X-ray diffraction imaging] XRDI technique can detect cracks, edge defects, and multiple problems that can cause the device to fail catastrophically during the back-end process and before packaging.” Samuel Lesko (Senior Director and General Manager of Bruker’s TSOM Business) added that Bruker’s white-light interferometry tools have become a vital and integrated part of the manufacturing process flow for our customers in advanced 2.5D packaging. ?? Read the full article: https://lnkd.in/g2ncjNxx #semiconductors #Metrology #SemiconductorIndustry

???????????????????? ???????????????????????? ?????????? ?????????????? ?????????????????????????? ???????? ????????????????, ????????????????, ?????? ??????????????. ?? Our research highlight with Dr. David Martínez Martín features his work in the lab at the University of Sydney and with other stakeholders to improve and develop nanotechnologies supporting key topics such as the behavior of yeast cells and their impact on the medical field. ?? David is an innovator with 19 patents and 17 of them licensed or assigned to industry. These technologies and techniques include an atomic force microscope coupled to a widefield microscope, or picobalance—a technique that allows the real-time and highly-accurate measurement of alive cells. ?? Give the full highlight a read to learn more about the samples and dynamic processes his lab regularly observes using a variety of approaches. Let us know what you find most interesting! #AFM #biomedical #engineering #microscopy

Don’t miss tomorrow's webinar on using Automated AFM for the non-destructive, inline process control of hybrid bonding in the semiconductor industry. Register today ?? https://lnkd.in/g7x-ghvW Automated AFM can be applied in the most current hybrid bonding technology nodes and wafer processing steps. This webinar will outline: ? Key features for process control in high volume manufacturing of bonded wafers ? High resolution imaging and analysis for critical bond pad metrology ? Large-area scanning of areas of up to 100s of mm2 of wafer-to-wafer bonding ? Automated bevel edge metrology for hybrid bonding ? Patterned and bare/blanket wafer defect review Don’t miss the Q&A session with the team: Sean Hand and Ingo Schmitz! Bruker’s fully automated AFM solutions enable the highly accurate, nanoscale characterization of surfaces. It delivers high-throughput data for inline process control and actionable data for hybrid bonding yield enhancement, and is ideal for labs and fabs working on new bonding device design. #automation #semiconductorindustry #qualitycontrol #afm

Join us at this FREE workshop on the nanoscale characterization of advanced materials, which we are holding in collaboration with The University of Huddersfield . To register ?? https://lnkd.in/gKEW6kWj Our special guest speakers are Dr. Josh Armitage, University of Leeds, and Prof. Liam Blunt, Dpt. of Engineering, University of Huddersfield. Have your sample measured in the practical sessions on the ContourX-500?profilometer and UMT TriboLab?mechanical testing systems! Don’t miss the chance to learn about: * The latest developments and advanced materials characterization using nanoindentation, 3D optical profiling, and tribology techniques * Applications ranging from precision engineering to the characterization of MEMS, sensors, and orthopedics, as well as scratch and lubricant testing. Discuss your applications with the team: Mohamadou Diew, PhD, Dr. Peter Sch?n, Penelope Downes (Livesey), and Boumedienne Boudjelida. #qualityassurance #nanotechnology #metrology #lubricants

??TODAY?? ?????????????? ???????????? ?? ?????????????? ?????? ???????????????? ????????, ???????????? ????????????????????, ?????? ???????????? ???????????????? Register today ?? https://lnkd.in/gEaptfYy In this webinar, guest speaker Prof. Jackson will present his work on numerical models of mixed-lubrication cases that incorporate coupled #electromagnetic, solid, and fluid mechanics solutions as well as effects from roughness. This comprehensive approach can result in models that are powerful analytical and predictive tools for applications where contacts can be electrified, such as electric vehicles, power generation, and spacecraft. ???????? ???? ?????? ???????? ?????????????? ???? ??????????: ? The relevance of effective friction, wear, and lubrication (tribology) practices, and how surface roughness can be an important factor ? What changes and new considerations arise when an electrical current is introduced across the contacts ? How numerical models can be built to address the factors of added electrical current and multi-length-scale surface roughness ?????????????? ?????????????? ?? Robert L. Jackson, Ph.D. Professor of Mechanical Engineering Auburn University #EVs #tribology #Friction

?? ?????????????????????? ????????: ???????????????????????? ?????? ???????????????? ???????????????????? ?????? ????????! To register and submit an abstract, please visit ?? https://lnkd.in/gZbKB_4H Nanobrücken 2025 will take place in Halle (Saale), Germany. Our kind host is the Fraunhofer Institute for Microstructure of Materials and Systems IMWS. Nanobrücken is Bruker’s annual conference on nanomechanical and nanotribological testing. It brings together top international researchers and industrial leaders for talks on the latest state-of-the art developments in metrology, live demos, and ample opportunities to network with peers and the Bruker team: Rhys Jones, Ude Hangen, Jaroslav Luke?, Oden Warren, and Douglas Stauffer. Topics include: ? Advanced nanoindentation and associated techniques ? Testing in extreme environments ? In-situ SEM/TEM, theory/simulation and biomechanical testing ???????????????? ???????????????????? - ???????????????? ???? ?????????????? ???????? We hope to see you there! Fraunhofer Institute for Microstructure of Materials and Systems IMWS Fraunhofer-Gesellschaft #nanotechnology #materialscience #qualityassurance

??TODAY?? ???????????????? ???????????? ???????????????? ???? ?????????????????????????? ?????????????? ???????????? ?? ???????????????? ???????????????? ???????????????????? Register ?? https://lnkd.in/grHjfDz3 In this webinar, presenters will cover recent advances in in-situ nanomechanics testing, highlighting a case study on fracture toughness in nitride hard coatings. They will also introduce the PI 89 Auto PicoIndenter—which automates nanoindentation mapping for correlating microstructure with #mechanical properties—and explore processing-structure-mechanical property relationships using this high-throughput in-situ system. ???????? ???? ?????? ???????? ?????????????? ???? ??????: ? Research on the influence of columnar grain boundaries on the fracture toughness of nitride hard coatings, determined using in-situ SEM microcantilever fracture tests ? An introduction to the PI 89 Auto PicoIndenter for streamlined correlation of microstructure and mechanical properties ? Evaluation of processing-structure-property relationships in structural materials as determined using PI 89 Auto to correlate EBSD, EDS, and nanoindentation maps ?????????????? ???????????????? ?? Subin Lee, Ph.D. Group leader, Applied Materials Karlsruhe Institute of Technology ?? Kevin Schmalbach, Ph.D. Instrumentation Scientist, Nanoindentation Unit Bruker #materialstesting #webinar

?????????? ?????? ?????????????? ????????????????????, ????????????????, ?????? ?????????? ???????????????????????? ???? ??????-???? ?????? ???????????????????????? ???????????????????????????????? WATCH: https://lnkd.in/gQQU_KHN In this webinar, Bruker experts: ? Introduce the photothermal AFM-IR technique ? Explore the simple mechanism underlying the technique ? Highlight a few of AFM-IR’s many broad applications ? Demo photothermal AFM-IR on the Dimension IconIR system In the below clip, Cassandra Phillips, Senior Product Manager, Nanoscale IR Spectroscopy, explains how AFM-IR combines the spatial resolution of AFM with the chemical analysis capability of FTIR. #materialsscience #nanotechnology #Spectroscopy

Don’t miss this LIVE webinar on using Automated AFM for the non-destructive, inline process control of hybrid bonding in the semiconductor industry. Register today ?? https://lnkd.in/gpkCUgXw Automated AFM can be applied in the most current hybrid bonding technology nodes and wafer processing steps. This webinar will outline: ? Key features for process control in high volume manufacturing of bonded wafers ? High resolution imaging and analysis for critical bond pad metrology ? Large-area scanning of areas of up to 100s of mm2 of wafer-to-wafer bonding ? Automated bevel edge metrology for hybrid bonding ? Patterned and bare/blanket wafer defect review Don’t miss the Q&A session with the team: Sean Hand and Ingo Schmitz! Bruker’s fully automated AFM solutions enable the highly accurate, nanoscale characterization of surfaces. It delivers high-throughput data for inline process control and actionable data for hybrid bonding yield enhancement, and is ideal for labs and fabs working on new bonding device design. #automation #semiconductorindustry #qualitycontrol #afm