What are the best practices for using Scanning Electron Microscopy (SEM) to characterize nanomaterials?
Scanning Electron Microscopy (SEM) is a powerful technique for imaging and analyzing the surface morphology, composition, and structure of nanomaterials. However, to obtain reliable and accurate results, you need to follow some best practices before, during, and after the SEM operation. In this article, you will learn how to prepare your samples, optimize your settings, interpret your images, and avoid common pitfalls when using SEM to characterize nanomaterials.