How do you choose the best test coverage metric for your IC design?
Testing is a crucial stage in integrated circuit (IC) design, as it ensures the quality, reliability, and functionality of the final product. However, testing can also be time-consuming, costly, and complex, especially for large and sophisticated ICs. Therefore, choosing the best test coverage metric for your IC design is an important decision that can affect your testing efficiency and effectiveness. In this article, we will explain what test coverage metrics are, why they matter, and how to select the most suitable one for your IC design.